XT H 225 for all-purpose X-ray and CT inspection

nikon metrology xray ct computed tomography XTH225The entry-level XT H 160 and the versatile XT H 225 systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.

Benefits

  • Proprietary 225 kV microfocus X-ray source with 3 µm focal spot size
  • Easy system operation and low cost-of-ownership
  • Stunning images providing great insight
  • High performance image acquisition and volume processing
  • Straightforward inspection automation
  • Safety first

Applications

  • Fault detection and failure analysis
  • Assembly inspection of complex mechanisms
  • Dimensional measurement of internal components
  • Part-to-CAD comparison
  • Advanced material research
  • Analysis of the biological structures
  • Digital archiving of models

 

 

 

 

 

 

 

 

 

 

 

 


Benefits & features

Superior accuracy and performance through proprietary 225 kV microfocus X-ray source

The default microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability. Regardless of the target of choice, the XT H 225 system uses an open-tube X-ray source that guarantees a lower cost-of-ownership


Stunning images from internal structures

A small spot size and a high-resolution flat panel create sharp images.  Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.

nikon metrology xray ct computed tomography XTH225ST materials


nikon metrology xray ct computed tomography XTH225ST high performance processingHigh performance processing

The core of the processing power is situated in the XT software suite that builds on Nikon Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users. XT Software also brings the fastest reconstruction of CT data currently available on a single PC. This PC is built from standard components to aid serviceability. The sample throughput can be improved further by the use of additional PCs. The complete system is also ready for any market leading CT visualization and processing software, such as VolumeGraphics.


nikon metrology xray ct computed tomography XTH225ST easy operationEasy operation and automation

Users are operational with the system within a few days of training. A CT wizard guides operators through the data acquisition process.

Customizable macros automate the measurement workflow, and tight integration with industry-standard post-processing applications streamline the decision making process.


Safety first

Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation


Low cost of ownership

The open X-ray tube allows for local maintenance of internal tube components. The 3-wheel transportation incorporated to easily manoeuvre through double-door entries. Also no special floor treatment is to install XT H 225.


Configure the system to your specific needs

Specific applications require more detailed images or higher accuracy. XT H 225 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs. 
XT H 225ST system is an extended version to hold larger samples up to 50 kg with a diameter of about 50 cm.

 

Specifications

Microfocus source        Max. kV Max. power Focal spot size Focal spot size XT H 160  XT H 225
160 kV Reflection target  160 kV 225 W 3 µm up to 7 W 225 µm at 225 W  alternative configuration  
180 kV Transmission target 180 kV 20 W 1 µm up to 3 W  10 µm at 10 W     alternative configuration
225 kV Reflection target 225 kV 225 W 3 µm up to 7 W 225 µm at 225 W    basic configuration

 

Detectors                   # Bits Active pixels Pixel Size Max. frame rate at
1x1 binning
Max. frame rate at
2x2 binning
XT H 160 XT H 225
Varian 1313Dx 16-bit 1000 x 1000 127 µm 30 fps 60 fps  alternative configuration   
Varian 2520Dx 16-bit 1900 x 1500 127 µm 12.5 fps 30 fps alternative configuration  alternative configuration 
Varian 4030 14-bit 2300 x 3200 127 µm 3 fps  7 fps    alternative configuration
Perkin Elmer 0820 16-bit 1000 x 1000 200 µm 7.5 fps  15 fps   alternative configuration  alternative configuration 

 
 basic configuration:  Basic configuration
 alternative configuration :  Alternative configuration

Manipulator              XT H 160/ XT H 225
# Axes 5

Axes travel

(Typical values - Exact values depend on system configuration)

(X) 185 mm
(Y) 250 mm
(Z) 625 mm
(Tilt) +/- 30
(Rotate) n*360°
Max. sample weight 15 kg

 

General                    
Cabinet dimensions (LxWxH) 1,830 mm x 875 mm x 1,987 mm
Weight 2,400 kg
Safety All systems are manufactured to IRR99
Control software  All systems are controlled by Nikon Metrology’s in-house Inspect-X software 

 

 

 

 

 

 

 

 

 


Ürün Tanıtım Videoları



Ürün Broşürleri