JCM-6000 Plus NeoScope - Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL. Karfo Endüstriyel

overview

Benchtop scanning electron microscope

As an entirely new advanced imaging tool for life science and industrial inspection areas, combining a familiar neoscop a benchtop SEM extends your vision digital camera with high resolution and depth of field strong SEM. Niko Un Instruments and JEOL neoscop arising from the combined expertise of SEM's advanced features are complemented by simplicity and affordability.

New JCM-6000 "neoscop to , the answer to the increasingly diversified needs between users worldwide that touch panel is a multifunction desktop scanning microscope.

Benefits & features

High performance system in a compact, innovative model

nikon metrology scanning electron microscopes JEOL NeoScope multi touch screen Ease of operation through the multi-touch screen or standard keyboard/mouse

Intuitive touch panel operation with new GUI

Well focused high resolution morphological observation
Secondary electron as well as Backscattered electron imaging for compositional distribution
Selectable accelerating voltages
High and Low vacuum operation
Full-featured Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology (Optional)
Metrology supported
Imaging of tilted, rotated samples (Optional)

Compact, light, and energy saving

Compact body equal to an optical microscope
Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

New capabilities for imaging

Simultaneous display of live and retrieved images allows for comparative observation
Secondary electron imaging and backscattered electron imaging supported at high vacuum
New high sensitivity solid state backscatter electron detector provides both composition and topographic imaging information
Dual frame imaging to facilitate comparison of live and retrieved images
A wide magnification range from the lowest 10x for wide area of view up to 60,000x

Enhanced low vacuum capability

New solid state backscattered electron detector
Easy observation of non conductive samples in the direct low vacuum mode
Only 2 minutes 30 seconds from sample loading to imaging

Simple operation

Easy touch panel operation
A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
Easy, dependable auto gun alignment (filament centering)

Tilt/rotation motor drive holder

nikon metrology scanning electron microscopes JEOL NeoScope tilt rotation motor drive holder

The tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.

Optional accessories

Energy dispersive X-ray spectrometer

Energy dispersive X-ray spectrometer (EDS) for elemental analysis
JEOL's proprietary EDS
Quick, reliable customer support guarantees satisfaction

_{*This option is retrofittable}

Samples

nikon metrology scanning electron microscopes JEOL NeoScope samples boron clusters Boron Clusters

Campanula PollenDendrites

Dendrites

Diatoms

nikon metrology scanning electron microscopes JEOL NeoScope samples flyseye Fly's Eye

Foam

$nikon metrology scanning electron microscopes JEOL NeoScope samples fractured concrete$ Fractured ConcreteInstant Coffee

Instant Coffee